product id: 96182
HZ-17 Probe Set for H Near-field Emission Measurements
Features:
Near-field measurements are often performed if, for example, a developer has to find out why an emission limit of an EMC standard is exceeded. Based on field strength measurements, the developer already knows several critical frequencies of the device or module under test. A practical way to reduce EMI is to analyze near fields, locate the sources and come up with targeted countermeasures. Furthermore, the passive near-field probes can also be used for immunity measurements.
H field probe RSH400-1
Owing to its large diameter (approx. 25 mm), the RSH400-1 probe for H field is extremely sensitive and provides the average of the magnetic field strength in the loop area of the probe. You can use the probe at a 10 cm distance around modules and instruments.
H field probe RSH2.5-2
The RSH2.5-2 H field probe can be used to selectively detect the current spectrum in conductor tracks and component leads such as on capacitors or ICs. The probe tip has a magnetically active groove of approx. 0.5 mm in width.
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