product id: 72291
When connected together, Model 2182A and Model 6220 or 6221 can be operated like a single instrument. The 2182A/622X combination is ideal for resistance measurements, pulsed I-V measurements, and differential conductance measurements, providing significant advantages over other solutions. The 2182A/622X combination is also well suited for many nanotechnology applications because it can measure resistance without dissipating much power in the device under test (DUT), which would otherwise invalidate results or even destroy the DUT.
Model 6221 AC and DC Current Source
Model 2182A Nanovoltmeter
The Need for Precision, Low Current Sourcing
Device testing and characterization for today's very small and power-efficient electronics requires sourcing low current levels, which demands the use of a precision, low current source. Lower stimulus currents produce lower – and harder to measure – voltages across the device. Combining Model 6221 AC and DC Current Source with a Model 2182A Nanovoltmeter makes it possible to address both of these challenges.
Differential Conductance
Differential conductance measurements are among the most important and critical measurements made on non-linear tunneling devices and on low temperature devices. Mathematically, differential conductance is the derivative of a device's I-V curve. Model 6221, combined with Model 2182A, is the industry's most complete solution for differential conductance measurements. Together, these instruments are also the fastest solution available, providing 10x the speed and significantly lower noise than other options. Data can be obtained in a single measurement pass, rather than by averaging the result of multiple sweeps, which is both time-consuming and prone to error. Model 6221 and 2182A are also easy to use because the combination can be treated as a single instrument. Their simple connections eliminate the isolation and noise current problems that plague other solutions.
| Features | Benefits |
| Measure resistances from 10 nΩ to 100 MΩ | Covers an extremely wide measurement range and specializes in ultra-low resistance measurements for characterizing high conductivity materials, nanomaterials, and superconducting materials. |
| Synchronized current-pulsed source and measurement times as short as 50 µs | Limits power dissipation in components such as nanodevices and nanomaterials that can be easily destroyed unless tested at very low power levels. |
| Delta mode current reversal, resistance measurement technique | Makes accurate ultra-low resistance measurements by eliminating the effects of thermal offsets and reduces noise down to 30nV p-p noise (typical) for one reading. Multiple readings can be averaged for greater noise reduction. |
| Differential conductance measurement | Offers speeds ten times faster and lower noise than other conductance measurement techniques. Good measurements are made without the need to average the results of multiple sweeps. |
| Nanovoltmeter and current source interface to work together seamlessly | Both instruments can be operated like a single instrument when making differential conductance and resistance measurements. |
| Delta, differential conductance, and pulse modes generate minimal current transients | Allows characterizing devices that can be easily disrupted by current spikes. |
| Condition |
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