E5061B/005/3L5/722/732: LF-RF network analyzer with DC bias source, 5 Hz to 3 GHz. (3L5) with Impedance Measurement Analysis (005).
Keysight E5061B is a member of the industry standard ENA Series network analyzers. The E5061B addresses a broad range of measurement needs of electronic components and circuits from low to high frequencies. The E5061B is the ideal solution for applications in industries such as wireless communications, aerospace and defense, computer, medical, automotive, CATV, plus many more.
Expanded frequency range
An expanded lower-end frequency range down to 100 kHz allows you to test components that require measurements in the 100 kHz range, such as LAN filters and automotive antennas.
Time domain/Fault location analysis (Option E5061B-010)
The time gating function is available in the time domain/fault location analysis function. This enables you to eliminate mismatch errors caused by test fixtures when testing CATV cables.
Comprehensive LF-to-RF network analysis
LF-RF NA option offers versatile network analysis in the broad frequency range from 5 Hz to 3 GHz (for 3L5). Comprehensive LF network measurement capabilities including built-in 1 Megohm inputs have been seamlessly integrated with the high-performance RF network analyzer. These analyzers are tthe right solution for component and circuit evaluations in the R&D environment.
S-parameter test port
The built-in S-parameter test set provides excellent dynamic range performance. This allows you to evaluate a variety of devices from near DC to RF ranges.
Gain-phase test port
The gain-phase test port provides direct receiver access for LF applications from 5 Hz to 30 MHz. The built-in 1 Megohm inputs allow you to easily perform in-circuit probing measurements for amplifiers and DC-DC converter control loops. The receiver ports can accurately measure amplifier’s CMRR/PSRR and PDN milliohm impedance by eliminating the measurement errors associated with the ground loop.
DC bias source
The built-in DC bias source internally superimposes the DC voltage up to ±40 Vdc onto the AC source signal at port-1 or LF OUT port. Also, it is possible to provide only the DC voltage from LF OUT port while measuring a DUT at the S-parameter test port.
