RIGOL DS70000-JITTA Real-time Eye Diagram and Jitter Analysis Option, DS70000 Series

DS70000-JITTA, Advanced Eye Diagram and Jitter Analysis (Option) for DS70000 Series Digital Oscilloscopes

To help engineers easily and conveniently resolve the jitter components within their signals, jitter measurements can be analyzed in multiple formats including the trend graph, spectrum graph, and histogram.

DS70000 series oscilloscope provides flexible and convenient jitter measurement and analysis. After purchasing and activating the DS70000-JITTER option, you can accurately and quickly make deterministic jitter measurements for serial clock signals or parallel bus signals.

• Constant: Fully automatic, semi automatic, and manual
• First-order PLL
• Second-order PLL
• Explicit

The jitter analysis function enables measurement and statistical analysis of uninterrupted bit sequences to efficiently debug signal jitter on large quantities of data. The jitter trend graph and histogram create a quick view of the nature and source of signal jitter, simplifying the engineer's work.

Eye Diagram

Based on the excellent bandwidth and sample rate, DS70000 series oscilloscope provides the real-time eye plot and measurement with the clock recovery function, which can be applied to protocol conformance analysis.

After the DS70000-JITTER option has been purchased and activated, DS70000 series supports the eye measurement for all the analog channels, and also provides measurement for several parameters of the eye diagram: eye height, eye width, eye amplitude, crossing percentage, and Q Factor. It also supports various clock recovery methods, such as Constant (automatic, semi-automatic, and manual), First-order PLL, Second-order PLL, and Explicit, to meet the demands of customers for different application scenarios.

With RIGOL's unique UltraVision III platform built on our custom ASIC technology, the DS70000 series digital oscilloscope delivers industry leading performance specifications including memory depth, waveform capture rate, and vertical resolution. It supports analysis of serial data on computer, embedded, automotive, audio and additional bus types.

UltraVision III also enables power integrity analysis as well as multi-domain debugging with simultaneous analysis of time domain and frequency domain signals. The DS70000 series fills an important need in high-speed signal integrity and debugging from R&D to industrial applications.