product id: 98946
Tektronix's 2nd Generation isolated measurement TIVP offers a compact form factor, enhanced accuracy, sensitivity and performance on the latest Tektronix oscilloscopes while providing the same unbeatable CMRR.
The TIVP Probes are optimized for and exclusively compatible with the latest 4, 5 and 6 Series Tektronix oscilloscopes. The probe will not function on other Tektronix oscilloscopes.
Tektronix IsoVu Gen 2 TIVP Isolated Probe Family PageIsoVu probe technology delivers accurate differential measurements up to
With versatile MMCX connectors and an unmatched combination of bandwidth, dynamic range, and common mode rejection, IsoVu Gen 2 probes are setting new standards for isolated probe technology and enabling wide bandgap power designs using SiC and GaN.
Benefits of IsoVu Probes
IsoVu technology uses power-over-fiber and an optical analog signal path for complete galvanic isolation between the measurement system and your DUT. By allowing the probe to float independently at the common mode voltage, isolation provides important advantages.
With traditional differential probes you had to choose between high bandwidth or high voltage levels. IsoVu probes, with their shielded coaxial cable and isolation, provide high bandwidth and a differential voltage range of
Tektronix TIVP Series Isolated Differential Scope Probes
IsoVu probe tips have a range of connections and accessories that offer high performance and accessibility. The probes can connect directly to MMCX connectors, which are inexpensive and widely-available. This makes for stable, hands-free test points and offer high bandwidth and common mode rejection. The solid metal body shields the center conductor and minimizes ground loop area for the lowest interference possible.
Other accessories are available to adapt the probe tips to a wide range of connections. Additional 0.100in and 0.200in spaced square-pin tips are available for applications that require greater than
Floating Measurements in Power Converter and Motor Drive Designs
Making high-side measurements in half-bridge power converters is challenging because the source or collector to which the measurements are referenced is slewing rapidly up and down. Wide bandgap devices like SiC and GaN FETs are even harder to measure because they can switch high voltages in a few nanoseconds. Noise from this rapidly changing common mode voltage leaks into the differential measurements and hides details on VGS and VDS. IsoVu probes have unmatched common mode rejection at full bandwidth that lets you see signal details, often for the first time.
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